A three-input CMOS NAND gate is designed as shown below. Assume that VDD=1.2 V, K'n = 90 uA/V2, Vtn = 0.4 V, K'p = 50 uA/V2, and Vtp=-0.5 V in the 100nm technology node. Determine the width of NMOS and PMOS transistors in this NAND gate, such that the worst case delay becomes equivalent to a referenced inverter with Wn=1um and Wp=2um. For the device sizes found in part (a), determine the switching threshold voltage, VM, when all inputs are tied together. Find the maximum IDD current for this NAND gate.

A three-input CMOS NAND gate is designed as shown below. Assume that VDD=1.2 V, K'n = 90 uA/V2, Vtn = 0.4 V, K'p = 50 uA/V2, and Vtp=-0.5 V in the 100nm technology node. Determine the width of NMOS and PMOS transistors in this NAND gate, such that the worst case delay becomes equivalent to a referenced inverter with Wn=1um and Wp=2um. For the device sizes found in part (a), determine the switching threshold voltage, VM, when all inputs are tied together. Find the maximum IDD current for this NAND gate.

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A three-input CMOS NAND gate is designed as shown below. Assume that VDD=1.2 V, K'n = 90 uA/V2, Vtn = 0.4 V, K'p = 50 uA/V2, and Vtp=-0.5 V in the 100nm technology node. Determine the width of NMOS and PMOS transistors in this NAND gate, such that the worst case delay becomes equivalent to a referenced inverter with Wn=1um and Wp=2um. For the device sizes found in part (a), determine the switching threshold voltage, VM, when all inputs are tied together. Find the maximum IDD current for this NAND gate.

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