For a CMOS inverter fabricated in a 65nm process with VDD = 1.0 V, Vtn = Vtp = 0.35 V, K′n = K′p = 500 A/V2, and having (W/L)n and (W/L)p = 4. Find TPHL, TPLH, and TP, when the equivalent load capacitance C = 4 fF. Use the method of average currents. Now, create a NAND gate with worst-case pull-up and pull-down that match the current drive of the inverter. Calculate the worst and best case delays with equivalent load capacitance C = 4 fF. Use the method of average currents.

For a CMOS inverter fabricated in a 65nm process with VDD = 1.0 V, Vtn = Vtp = 0.35 V, K′n = K′p = 500 A/V2, and having (W/L)n and (W/L)p = 4. Find TPHL, TPLH, and TP, when the equivalent load capacitance C = 4 fF. Use the method of average currents. Now, create a NAND gate with worst-case pull-up and pull-down that match the current drive of the inverter. Calculate the worst and best case delays with equivalent load capacitance C = 4 fF. Use the method of average currents.

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  1. For a CMOS inverter fabricated in a 65 n m process with V D D = 1.0 V , V t n = V t p = 0.35 V , K n = K p = 500 A / V 2 , and having ( W / L ) n and ( W / L ) p = 4 . Find T P H L , T P L H , and T P , when the equivalent load capacitance C = 4 f F . Use the method of average currents. Now, create a NAND gate with worst-case pull-up and pull-down that match the current drive of the inverter. Calculate the worst and best case delays with equivalent load capacitance C = 4 f F . Use the method of average currents.

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