Reflection by thin layers. In the figure, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1 and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). The table below provides the indexes of refraction n1, n2, and n3, the type of interference, and the wavelength λ in nanometers of the light as measured in air. Give the third least thickness L. n1 n2 n3 Type L λ 1.271.70 1.43 max 3rd 390

Reflection by thin layers. In the figure, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1 and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). The table below provides the indexes of refraction n1, n2, and n3, the type of interference, and the wavelength λ in nanometers of the light as measured in air. Give the third least thickness L. n1 n2 n3 Type L λ 1.271.70 1.43 max 3rd 390

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Reflection by thin layers. In the figure, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r 1 and r 2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). The table below provides the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, and the wavelength λ in nanometers of the light as measured in air. Give the third least thickness L . n 1 n 2 n 3 Type L λ 1.27 1.70 1.43 max 3 r d 390

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